Nanoscale evaluation of piezoelectric and ferroelectric properties using scanning probe microscopy
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Piezoelectric and ferroelectric materials have garnered significant interest due to their excellent physical properties and multiple potential applications such as non-volatile memories, multilayer ceramic capacitors, and nanogenerators. Accordingly, the need for evaluating piezoelectric and ferroelectric properties has also increased. The piezoelectric and ferroelectric properties are evaluated macroscopically using laser interferometers and polarization-electric field loop measurements. However, as the research focus is shifted from bulk to nanosized materials, scanning probe microscopy (SPM) techniques have been suggested as an alternative approach for evaluating piezoelectric and ferroelectric properties. In this presentation, I will summarize our recent effort on the nanoscale evaluation of piezoelectric and ferroelectric properties of diverse materials using SPM-based methods. Among the SPM techniques, the focus is on recent studies that are related to piezoresponse force microscopy and conductive atomic force microscopy. Further, I will briefly discuss how the sensitivity of the SPM can be improved based on the operational or characterization programs such as machine learning approach. This work can provide guidelines for evaluating the piezoelectric and ferroelectric properties of materials based on SPM techniques.